Combined Analytical Workflow for Spatially Resolved
Assessment of Surface and Interfacial Chemistry
Prof. Matjaz Finsgar (University of Maribor, Maribor/SVN)
Mittwoch, 25. Februar 2026, 17:15 Uhr
Technische Universität Graz - HS H „Ulrich Santner"
Kopernikusgasse 24, EG
Abstract:
Modern analytical chemistry increasingly relies on integrated workflows that couple information-rich analytical measurements with data analysis, uncertainty control, and validation to resolve chemical heterogeneity from macroscopic samples to micro- and nanoscale features. Electrochemical methods, spectroscopy, and chromatography enable compositional separation and determination of species in complex matrices. Still, many critical structure–function relationships are defined by chemistry confined to the outermost surface and near-surface region.
Surface analysis is therefore emphasized, with time-of-flight secondary ion mass spectrometry (ToF-SIMS) and X-ray photoelectron spectroscopy (XPS) presented as complementary pillars. ToF-SIMS enables chemically specific molecular fingerprinting with high spatial resolution, supporting 2D and 3D chemical mapping and depth profiling to visualize compositional gradients and micro-scale domains. Because ToF-SIMS datasets are typically fragment- rich and strongly affected by matrix effects, multivariate statistical analysis is essential for extracting chemical components, improving interpretability, and enhancing marker selection. XPS provides (semi)quantitative elemental composition and chemical-state information in the top few nanometers, offering an independent chemical descriptor that supports confident peak assignment, interfacial chemistry interpretation, and cross-validation of ToF-SIMS-derived findings. Together, ToF-SIMS, XPS, and multivariate analysis form a generalizable framework for obtaining spatially resolved chemical insight from heterogeneous materials and formulated systems.
CV: Professor Matjaž Finšgar is a university professor of Analytical Chemistry at the Faculty of Chemistry and Chemical Engineering, University of Maribor, where he heads the Laboratory for Analytical Chemistry and Industrial Analysis. He received his PhD in Analytical Chemistry in 2010 from the University of Ljubljana, following early research training as a young researcher at the Jožef Stefan Institute (2006–2010) and a postdoctoral fellowship at BASF SE in Germany (2011–2012). His latest research focuses on instrumental analytical chemistry, with an emphasis on trace analysis, electrochemical sensor development, and advanced surface analysis, particularly X-ray photoelectron spectroscopy (XPS) and tandem secondary ion mass spectrometry
(ToF-SIMS). He established an advanced surface analysis laboratory at the University of Maribor. Since 2019, he has held senior leadership roles, serving as Vice-Dean for Development and, since 2023, Vice-Dean for Development and Infrastructure. From 2023, he has also served as the technical lead for the University of Maribor’s participation in establishing a synchrotron beamline in Elettra together with TU Graz.
Professor Finšgar has received multiple recognitions, including the Prešeren Award, the Faculty Dean’s Award for research achievements, and the Zois Recognition for significant contributions to the development of unconventional tools in analytical chemistry. Since 2019, he has been listed annually among the top 2% of scientists worldwide in the Stanford ranking.